Phase-ambiguity-free and accurate permittivity determination from waveguide measurements
Özet
A microwave method has been proposed for accurate and unique extraction of relative complex permittivity (ϵr) of dielectric materials from 2π phase-ambiguity-free amplitude-only two-port and one-port scattering parameter measurements. Improved accuracy has been shown by the applied uncertainty analysis. For the validation of our method, ϵr of low-loss and lossy samples was extracted.
RDL Kalıcı Bağlantı (PID)
https://rdlopen.rawdatalibrary.net/r/munzur/665Resmi atıflarda kullanılan kalıcı adresİndeks kayıtları
Kaydın indeks veri tabanlarındaki sayfası (aktarımda alınan kayıt numarasıyla). Erişim, indeksin kendi koşullarına bağlıdır.Atıflar
- Scopus
- 2
- WoS
- 2
- OpenAlex
- 2
Tam Kayıt
| Alan | Değer | Dil |
|---|---|---|
| dc.contributor.author | Hasar, U.C. | |
| dc.contributor.author | Buldu, G. | |
| dc.date.accessioned | 2026-10-28T14:53:31.247995629Z | |
| dc.date.available | 2026-10-28T14:53:31.247995629Z | |
| dc.date.issued | 2017 | |
| dc.description.abstract | A microwave method has been proposed for accurate and unique extraction of relative complex permittivity (ϵr) of dielectric materials from 2π phase-ambiguity-free amplitude-only two-port and one-port scattering parameter measurements. Improved accuracy has been shown by the applied uncertainty analysis. For the validation of our method, ϵr of low-loss and lossy samples was extracted. | |
| dc.description.sponsorship | TUBITAK [114E495] | |
| dc.identifier.articlenumber | 084701 | |
| dc.identifier.doi | 10.1063/1.4997076 | |
| dc.identifier.eissn | 1089-7623 | |
| dc.identifier.issn | 0034-6748 | |
| dc.identifier.issue | 8 | |
| dc.identifier.pmid | 28863649 | |
| dc.identifier.scopus | 2-s2.0-85027404729 | |
| dc.identifier.uri | https://rdlopen.rawdatalibrary.net/r/munzur/665 | |
| dc.identifier.volume | 88 | |
| dc.identifier.wos | WOS:000409178100054 | |
| dc.language.iso | en | |
| dc.publisher | American Institute of Physics Inc. | |
| dc.relation.ispartof | Review of Scientific Instruments | |
| dc.rights | info:eu-repo/semantics/closedAccess | |
| dc.subject.classification | Instruments & Instrumentation | |
| dc.subject.classification | Physics, Applied | |
| dc.subject.classification | Physics | |
| dc.subject.other | Dielectric materials | |
| dc.subject.other | Extraction | |
| dc.subject.other | Permittivity | |
| dc.subject.other | Low-loss | |
| dc.subject.other | Microwave methods | |
| dc.subject.other | Phase ambiguity | |
| dc.subject.other | Relative complex permittivities | |
| dc.subject.other | Scattering parameter measurement | |
| dc.subject.other | Waveguide measurements | |
| dc.subject.other | microwave radiation | |
| dc.subject.other | uncertainty | |
| dc.subject.other | validation process | |
| dc.subject.other | article | |
| dc.subject.other | sensitivity analysis | |
| dc.subject.other | Uncertainty analysis | |
| dc.title | Phase-ambiguity-free and accurate permittivity determination from waveguide measurements | |
| dc.type | Article | |
| rdl.citation.openalex | 2 | |
| rdl.citation.scopus | 2 | |
| rdl.citation.wos | 2 | |
| rdl.department | Department of Electrical and Electronics Engineering, Gaziantep University, 27310 Gaziantep, Turkey | |
| rdl.department | Department of Electrical and Electronics Engineering, Munzur University, 62000 Tunceli, Turkey | |
| rdl.oa.status | closed | |
| rdl.scopus.quartile | Q2 | |
| rdl.source.index | SCOPUS | |
| rdl.source.index | WOS | |
| rdl.source.index | PUBMED | |
| rdl.wos.index | Science Citation Index Expanded (SCI-EXPANDED) |
