Surface Morphology, Structural, Photovoltaic and Optoelectronic Properties of Diamond Like Carbon-Copper Nanostructures

In this work, we produced Cu doped diomond like carbon films using the magnetron sputtering technique and assessed their structural electrical and optoelectronic characteristics. In the atomic force microscopy (AFM) measurements, it was observed that the surface of the Cu-DLC nanocomposite films was in a granular form and the presence of cluster-like formations. D and G bands, which are the characteristic peaks of the DLC structure, were observed in the Raman spectrum, while Cu and C peaks were observed in the energy dispersive (EDX) spectrum. Photocurrent, photocapacitance, photosensitivity and photoresponse values increased depending on the increasing light intensity. However, the Cu-DLC/n-Si structure displayed low photovoltaic properties. The capacitance and conductance values were considerably affected by the increase in AC signal frequency. The series resistance and the density of the interface states exhibited low frequency dependent behavior which were obtained using the electrical characteristics of the nanocomposite films.