The effect of high entropy oxide on radiation shielding parameters of erbium oxide doped glasses

High-entropy materials are one of the most studied topics in recent years due to the extraordinary properties they exhibit. High entropy oxide (HEO) is a group of materials that have been studied for different applications. However, the effects of HEOs on the radiation properties of glasses are not well known. In this study, the structural, radiation and neutron shielding properties of SiO2 glass systems doped erbium oxide reinforced with refractory high entropy oxide (RHEO) with the formula TiMoNbTaWZrO11 were investigated. RHEAs used in the study were produced and characterized in our laboratory. Then, they were added to the glass samples at different rates together with Erbium oxide. As a result of SEM-EDS and XRD analyses, it was determined that the additives were distributed very homogeneously on the glass. The composition of glass systems is [95SiO2+(5-x)Er2O3+x TiMoNbTaWZrO11], where (x = 0, 0.5, 1 and 2 %, mol). The linear and mass attenuation coefficients (LAC and MAC), mean free path (MFP), half-value layer (HVL) and effective atomic numbers (Zeff) and effective electron density (Nel) of the glass structures were experimentally measured at the energy region of 53.16–661.62 keV. Also, the equivalent dose rates due to fast neutrons absorption were measured by using an 241Am–Be fast neutron source. Exposure buildup factor (EBF) and fast neutron removal cross section (ΣR) were theoretically determined. The proton and alpha shielding parameters of glasses were calculated. It is observed that glasses containing higher amounts of refractory high entropy oxide, within the SiO2–Er2O3 composition, demonstrated enhanced capabilities for shielding against radiation and neutrons.